Please ask your local reseller.
I bought 2SK366@￥76 (about $0.7) and 2SJ107@￥86 (about $0.8).
The normal full production prices would not have supported 100% noise test. In the same era that these parts were introduced we tested 100% for noise in a Quantech by hand 1 at a time.
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I bought these not too long ago, I might measure the noise. BTW the Yfs vs Id plots on these parts are exact cut and paste from the SK170/SJ74 ones.
100% screening for noise would be expensive, it takes some time. Toshiba might actually have been sampling. There are reports of noisy genuine 2SK170 parts, although this might be a result of ESD damage from handling.
Not sure but I have measured genuine Toshiba parts with excess low frequency noise, but not pop-corn noise. One possible scenario is wafer level sampling and assigning the entire wafer to another part number. It is pretty clear to me these are all the same die, the data sheet curves are simply too close.
Noise figure damage caused by avalanching a junction is one of those things that was mentioned in early low noise opamp and RF transistor datasheets, but seems to have been mostly forgotten. I see photos of 2SK170s in plastic bags and people testing them without any ESD precautions
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